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Line X Tester Analysis for Yield and Grain Mold Resistance in Kharif Sorghum [Sorghum bicolor (L.) Moench]

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Title Line X Tester Analysis for Yield and Grain Mold Resistance in Kharif Sorghum [Sorghum bicolor (L.) Moench]
 
Creator Ramaling Hundekar
 
Contributor M.Y. Kamatar
 
Subject Genetics and Plant Breeding
 
Description Investigation aimed to identify good general combiners and study the heterosis
for yield and grain mold resistance in sorghum. Thirty two hybrids derived from
mating four well adopted testers with eight mold resistant lines in L x T design and
their parents were evaluated along with resistant and susceptible checks.
Heterosis over commercial check CSH 16 for grain yield ranged between -
62.86 and 33.94 percent. Economic heterosis varied from -22.43 to 28.46% for test
weight. The parents DSV 6, DNB 4, GMRP 16, GMRP 108, GMRP 97 were good
general combiners for grain yield traits and mold resistance traits. The crosses DNB 4
x GMRP 950-285, DNB 1 x GMRP 97, SPV 570 x GMRP 16 and DNB 1 x GMRP
108 were best specific combiners for most of the traits. DSV 6 x GMRP 97, DNB 4 x
GMRP 108 and DSV 6 x GMRP 16 exhibited higher grain yield. Fusarium and
Curvularia caused mold on sorghum grain in Dharwad region of which Fusarium was
higher in frequency. Hybrid DNB 4 x GMRP 950-285 had highest germination
percentage of 78.59 had 11.45% of Fusarium infection. DSV 6 x GMRP 16 had
12.24% Curvularia infection on the seeds. Hybrids SPV 570 x GMRP 16, DNB 1 x
GMRP 81, DNB 4 x GMRP 950-285 and DNB 4 x GMRP 108 were identified with
variable resistance for Fusarium and Curvularia infection with acceptable level of
germination.
Correlation and path co-efficient analysis revealed to lay pressure on selection
for plant height, panicle length, and maturity and test weight for increasing the grain
yield in sorghum.
 
Date 2016-11-21T16:54:08Z
2016-11-21T16:54:08Z
2012
 
Type Thesis
 
Identifier http://krishikosh.egranth.ac.in/handle/1/86760
 
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