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STANDARDIZATION OF X-RAY RADIOGRAPHY METHODOLOGY FOR THE DETECTION OF HIDDEN INSECT INFESTATION IN CEREALS AND PULSES

KrishiKosh

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Title STANDARDIZATION OF X-RAY RADIOGRAPHY METHODOLOGY FOR THE DETECTION OF HIDDEN INSECT INFESTATION IN CEREALS AND PULSES
 
Creator RAMAKRISHNAN. N
 
Contributor RAMESH BABU, T
 
Subject STANDARDIZATION, RADIOGRAPHY, METHODOLOGY, DETECTION, HIDDEN, INSECT, INFESTATION ,CEREALS,PULSES
 
Description Standardization of X-ray radiography methodology for the detection of hidden
insect infestation in cereals and pulses was undertaken during November 2009 –
March 2010.
The experimental results showed that the voltage, current and exposure period
for the detection of hidden insect infestation were varied with different seed materials
that had taken for present investigation. High voltage and current is required for dense
seed materials for adequate penetration compared to light seed materials. Good
contrast of image was obtained, when the exposure period varied from 20 - 25
seconds.
The standardized X-ray radiography input values viz., voltage, current and
exposure period for paddy were 15 KV, 12 mA for 25 seconds to detect the hidden
infestation damage caused by Angoumois grain moth, Sitotroga cereallela.
Standardized voltage, current and exposure period for wheat, sorghum and maize
seeds infested with Lesser grain borer, Rhizopertha dominica were 15 KV, 12 mA for
25 seconds; 20 KV, 6 mA, for 25 seconds; and 25 KV, 8 mA for 20 seconds
respectively. The best combinations of input value selected for the detection of hidden
infestation of pulse beetle, Callosobruchus chinensis were 20 KV, 10 mA, 25 seconds
for urdbean and mungbean; 20 KV, 12 mA for 25 seconds for cowpea; 25 KV, 10
mA, 25 seconds for soybean; 15 KV, 12 mA, 25 seconds for lentil; and 25 KV, 8 mA,
25 seconds for Dolichos.
Usage of sticky (adhesive) tapes was found highly helpful to locate and pick
out the hidden infested seed from the healthy ones.
X-rays emanating from the present voltage and current intensities used to
detect the hidden infestation are soft X-rays and do not affect the viability of the seed
materials. Germination percentage for different X-ray combinations varied from 90-
100% for paddy, wheat, sorghum and 80-100% for maize. Similarly the germination
percentage of pulses that were subjected to investigation varied from 80-100% for
urdbean, mungbean, cowpea, soybean, lentil, french bean and 90-100% for Dolichos.
 
Date 2016-08-06T14:00:18Z
2016-08-06T14:00:18Z
2010
 
Type Thesis
 
Identifier http://krishikosh.egranth.ac.in/handle/1/71275
 
Language en
 
Relation D8577;
 
Format application/pdf
 
Publisher ACHARYA N.G. RANGA AGRICULTURAL UNIVERSITY RAJENDRANAGAR, HYDERABAD