Record Details

Biochemical and molecular characterization of mutants of tetraploid wheat against spot blotch caused by bipolaris sorodiniana SACC. (SHOEM)

KrishiKosh

View Archive Info
 
 
Field Value
 
Title Biochemical and molecular characterization of mutants of tetraploid wheat against spot blotch caused by bipolaris sorodiniana SACC. (SHOEM)
 
Creator Pradeep P.E
 
Contributor I.K.Kalappanavar
 
Subject Plant pathology
 
Description The investigation was conducted with 174 free threshable and 176 non free threshable
mutant lines. Among free threshable mutants, physical irradiation with gamma rays showed
high effect in getting more number of spot blotch resistant lines (70.15%) in M3 generation.
In M4 generation, EMS treated mutant lines have given more number of spot blotch resistant
lines (52.11%). Irradiation treatment on DDK-1001 has given highest effect in getting more
number of resistant lines both in M3 and M4 generation. Among free threshable mutant lines
23 have shown resistance both in M3 and M4 generation. Among non free threshable mutants,
physical irradiation with gamma rays has shown high effect in getting more number of spot
blotch resistant lines (65%) in M3 generation and 80% in M4 generation. Irradiation treatment
on the DDK-1001 x DWR-1006 has given more number of spot blotch resistant lines.
Biochemical studies indicated that Spot blotch resistant free threshable and non free
threshable mutant lines recorded lower reducing sugar, total carbohydrates and higher total
phenol, OD phenol, wax and total protein when compared with susceptible parent DDK-
1001. The increase in total phenol, total protein and total carbohydrates was more in infected
leaves as compared to healthy ones. However, due to infection the reducing sugar, OD phenol
and wax were decreased. Free threshable mutant lines recorded high amount of total phenol,
OD phenol, total protein, wax and less amount of reducing sugar, total carbohydrates as
compared to non free threshable mutant lines.
Molecular characterization of mutant lines and untreated parents by RAPD revealed
that OPM-18 produced an unique amplified fragment (1100bp) in spot blotch susceptible
mutant lines and also in susceptible parent DDK-1001 as compared to resistant lines. OPB-01
(450bp) and OPA-07 (250bp) produced specific bands in non free threshable mutant lines and
also in parent DDK-1001 as compared to free-threshable.
 
Date 2016-11-10T13:49:39Z
2016-11-10T13:49:39Z
2010
 
Type Thesis
 
Identifier http://krishikosh.egranth.ac.in/handle/1/84860
 
Format application/pdf
 
Publisher UAS, Dharwad