ICAR Research Data Repository for Knowledge Management
SPECTROSCOPIC MULTILAYER FILM THICKNESS MEASUREMENT SYSTEM
CSIR - Madras Complex(CMC)
View Archive Info| Field | Value | |
| Title |
SPECTROSCOPIC MULTILAYER FILM THICKNESS MEASUREMENT SYSTEM
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| Creator |
HORIE, M
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| Type |
text
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| Publisher |
SPIE OPTICAL ENGG. USA
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| Date |
1996
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| Language |
eng
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| Description |
SPIE, USA
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| Subject |
PHYSICS
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| Identifier |
http://opac.csircmc.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=2295
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