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<strong>Determination of defect density, crystallite size and number of graphene layers in graphene analogues using X-ray diffraction and Raman spectroscopy</strong>

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Title Statement <strong>Determination of defect density, crystallite size and number of graphene layers in graphene analogues using X-ray diffraction and Raman spectroscopy</strong>
 
Added Entry - Uncontrolled Name Saini, Parveen ; Polymeric & Soft Materials Section, National Physical Laboratory, New Delhi 110012, India
Sharma, Rahul ; Polymeric & Soft Materials Section, National Physical Laboratory, New Delhi 110012, India
Chadha, Neakanshika ; Conjugated Polymers & Graphene Technology Laboratory, CSIR-National Physical Laboratory, New Delhi 110 012, India
DST, CSIR
 
Uncontrolled Index Term instrumentation and techniques of general use in physics; Materials Science, Graphene
Graphitic oxide (GrO); graphene, reduced graphitic oxide (RGrO); graphene; Raman Spectroscopy; D-band; G-band; defect density; crystallite size; sp2 domains; X-ray diffraction (XRD); Full width half maximum (FWHM)
 
Summary, etc. In this study, X-ray diffraction and Raman spectroscopic techniques have been wielded for determination of number of graphene layers per domain, crystallite size, interlayer spacing and defect density in bulk samples of chemically synthesized graphitic oxide (GrO) and reduced GrO (RGrO). Particularly, the ready to use and general mathematical equations have been presented for obtaining above mentioned parameters directly using the full width half maxima (FWHM) of XRD peaks and intensity ratios of Raman D- and G-bands. The results reflect that upon reduction, crystallites shrink in dimensions ultimately leads to decrease in number of graphene layers per domain and apparent increase in defect density.
 
Publication, Distribution, Etc. Indian Journal of Pure & Applied Physics (IJPAP)
2017-10-09 09:45:39
 
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http://op.niscair.res.in/index.php/IJPAP/article/view/16047
 
Data Source Entry Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 55, ##issue.no## 9 (2017): Indian Journal of Pure & Applied Physics
 
Language Note en
 
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