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<strong>Studies on triple junction electric field in ferroelectric cathodes</strong>

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Title Statement <strong>Studies on triple junction electric field in ferroelectric cathodes</strong>
 
Added Entry - Uncontrolled Name Meduri, Ravi ; Microwave Tube Research & Development Centre, Defence Research & Development Organization(DRDO)
Bhat, K S ; Microwave Tube Research & Development Centre, Defence Research & Development Organization(DRDO)
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Uncontrolled Index Term Physical Electronics
Electron Emission; Ferroelectric Cathodes; Field Enhancement; Triple Point Junction
 
Summary, etc. To investigate the effect of grid thickness and dielectric constant on the ferroelectric cathode triple junction electric field distribution in a two-dimensional structure, simulation has been carried out using finite element method (FEM) code ANSYS. Triple junction electric field plays a major role in the emission of electrons from a ferroelectric cathode and it approaches towards its limiting value even if the dielectric constant of the ferroelectric material is increased considerably. It is important to increase the triple junction electric field without increasing the applied field to reduce the mechanical stresses in the ferroelectric material. A dielectric layer (ε<sub>r</sub>&lt;100) has been introduced between the ferroelectric material and the grid to increase the triple junction electric field. FEM simulation results showed that the triple junction electric field is more than 48 times the applied field in this case. This structure not only enhances the triple junction electric field but it also changes the <em>E</em><sub>||</sub> and <em>E</em><sub>┴</sub> ratio (β) favorably. Effects of dielectric constant and the thickness of the dielectric layer on triple junction electric field have been studied.
 
Publication, Distribution, Etc. Indian Journal of Pure & Applied Physics (IJPAP)
2018-01-29 09:25:55
 
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http://op.niscair.res.in/index.php/IJPAP/article/view/14806
 
Data Source Entry Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 56, ##issue.no## 01 (2018): Indian Journal of Pure & Applied Physics
 
Language Note en
 
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