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Statistical Modeling Of Transistor Mismatch Effects In 100nm CMOS Devices

Electronic Theses of Indian Institute of Science

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Field Value
 
Title Statistical Modeling Of Transistor Mismatch Effects In 100nm CMOS Devices
 
Creator Srinivasaiah, H C
 
Subject Complimentary Metal Oxide Semiconductor Devices
CMOS Devices
Transistor Mismatch
Electronic Engineering
 
Contributor Bhat, Navakanta
 
Date 2011-05-16T05:05:02Z
2011-05-16T05:05:02Z
2011-05-16
2004-07
 
Type Thesis
 
Identifier http://etd.iisc.ernet.in/handle/2005/1202
http://etd.ncsi.iisc.ernet.in/abstracts/1563/G18591-Abs.pdf
 
Language en_US
 
Relation G18591