ICAR Research Data Repository for Knowledge Management
Interference Enhanced Raman Spectroscopy Of Ultra Thin Crystalline Ge & Si Films And Their Interfaces
Electronic Theses of Indian Institute of Science
View Archive Info| Field | Value | |
| Title |
Interference Enhanced Raman Spectroscopy Of Ultra Thin Crystalline Ge & Si Films And Their Interfaces
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| Creator |
Kanakaraju, S
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| Subject |
Semiconductor Films
Thin Films - Raman Spectroscopy Raman Spectroscopy Ge Films Si Films Instrumentation |
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| Contributor |
Mohan, S
Sood, A K |
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| Date |
2012-10-22T05:23:28Z
2012-10-22T05:23:28Z 2012-10-22 1997-05 |
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| Type |
Thesis
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| Identifier |
http://etd.iisc.ernet.in/handle/2005/1763
http://etd.ncsi.iisc.ernet.in/abstracts/2289/G14904-Abs.pdf |
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| Language |
en_US
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| Relation |
G14904
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