ICAR Research Data Repository for Knowledge Management
Multilayer film deposition characterization by reflectometry techniques and their structure property correlation
Shodhganga@INFLIBNET
View Archive Info| Field | Value | |
| Title |
Multilayer film deposition characterization by reflectometry techniques and their structure property correlation
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| Contributor |
Basu, Saibal
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| Subject |
Correlation
Film deposition Multilayer Reflectometry |
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| Description |
Abstract available
Reference p.134-142 |
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| Date |
2016-04-08T11:23:04Z
2016-04-08T11:23:04Z n.d. 2015 n.d. |
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| Type |
Ph.D.
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| Identifier |
http://hdl.handle.net/10603/79579
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| Language |
English
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| Relation |
-
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| Rights |
university
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| Format |
142p.
- None |
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| Coverage |
Physical Science
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| Publisher |
Mumbai
Homi Bhabha National Institute Department of Physical Sciences |
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| Source |
INFLIBNET
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