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<strong>Improvement in short-circuited coaxial flange for evaluating microwave superconducting properties at low temperature</strong>

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Title Statement <strong>Improvement in short-circuited coaxial flange for evaluating microwave superconducting properties at low temperature</strong>
 
Added Entry - Uncontrolled Name Kalra, Yogita ; TIFAC-CORE in Fiber Optics and Optical Communication, Department of Applied Physics, Delhi Technological University, Bawana Road, Delhi
M Patel, Sandhya ; Time and Frequency and Electrical and Electronics Metrology, CSIR-National Physical Laboratory, New Delhi 110 012, India Academy of Scientific and Innovative Research, CSIR- National Physical Laboratory, New Delhi 110 012, India
Ojha, V N ; Time and Frequency and Electrical and Electronics Metrology, CSIR-National Physical Laboratory, New Delhi 110 012, India Academy of Scientific and Innovative Research, CSIR- National Physical Laboratory, New Delhi 110 012, India
Sinha, R K ; TIFAC-CORE in Fibre Optics and Optical Communication, Department of Applied Physics, Delhi Technological University, Bawana Road, Delhi 110 042, India
 
Uncontrolled Index Term pecific instrumentation and techniques of general use in physics
Thin superconductor film; Surface impedance; Microwave conductivity; Skin depth
 
Summary, etc. In the present study, we have proposed an improvement in terms of the determination of S-parameters of an open flange from its characteristic impedance and propagation constant. With the help of these S-parameters, the actual reflection coefficient of YBCO films deposited on LAO substrate is obtained from the measured reflection coefficient. The surface impedance of three YBCO films is obtained in the range of few ohms in the frequency range from 1 GHz to 40 GHz. The surface resistance of the films reduces at liquid nitrogen temperature, i.e., 77 K, whereas, the surface reactance slightly increases due to kinetic inductance. The conductivity and skin depth are also determined to validate the improvement in the method.
 
Publication, Distribution, Etc. Indian Journal of Pure & Applied Physics (IJPAP)
2020-01-23 12:25:31
 
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http://op.niscair.res.in/index.php/IJPAP/article/view/25426
 
Data Source Entry Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 58, ##issue.no## 1 (2020): Indian Journal of Pure & Applied Physics
 
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