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Dataset for: Trait Observation Network (TON) Panel, clones under evaluation for late blight resistance

International Potato Center Dataverse OAI Archive

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Title Dataset for: Trait Observation Network (TON) Panel, clones under evaluation for late blight resistance
 
Identifier https://doi.org/10.21223/P3/JJJQV0
 
Creator Bonierbale, Merideth
Lindqvist-Kreuze, Hannele
Getinet, Hirut
Gastelo, Manuel
Qin, Junhong
Maccera, Chiara
Li, Xianping
 
Publisher International Potato Center
 
Description The assessment of late blight resistance in TON panel genotypes was conducted in experimental trials under field conditions with high endemic disease pressure. The percentage of leaf area affected by late blight infection was recorded by plot throughout the season to subsequently compute the area under the disease progress curve (AUDPC). Since AUDPC is subject to variation from factors that are experiment specific it cannot be used to compare values accross trials. AUDPC values were used to compute the relative AUDPC (rAUDPC) and predicted susceptibility scale value (sAUDPC), which are comparable accross trials
 
Subject Agricultural Sciences
Potatoes
Late Blight
Phytophthora infestans
 
Language English
 
Contributor Administrator, CIP
CGIAR Research Program on Roots, Tubers and Bananas (RTB)
Deutsche Gesellschaft für Internationale Zusammenarbeit (GIZ)
International Potato Center
Project: Accelerating the Development of Early-Maturing-Agile Potato for Food Security through a Trait Observation and Discovery Network
Yunnan Academy of Agricultural Sciences (YAAS)
Ethiopian Institute of Agricultural Research (EIAR)
 
Type xls