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<strong>Simulation of the process variation in negative capacitance virtual-source carbon nanotube FET devices and circuits</strong>

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Title Statement <strong>Simulation of the process variation in negative capacitance virtual-source carbon nanotube FET devices and circuits</strong>
 
Added Entry - Uncontrolled Name Muthu, Bharathi Raj; Department of Electronics and Communication Engineering, College of Engineering Guindy, Anna University, Chennai 600 025, Tamil Nadu, India
Solomon, Ewins Pon Pushpa; Department of Electronics and Communication Engineering, College of Engineering Guindy, Anna University, Chennai 600 025, Tamil Nadu, India
Dhandapani, Vaithiyanathan ; Department of Electronics and Communication Engineering, National Institute of Technology Delhi, Delhi 110 040, India
 
Uncontrolled Index Term Carbon nanotube field effect transistors, Ferroelectric, Negative capacitance, Short channel effects
 
Summary, etc. <p class="Abstract"><span lang="EN-GB">We have reported the impact of process variation of virtual- source carbon nanotube field-effect transistor (VS-CNFET) device externally connected to the epitaxial ferroelectric (FE) capacitor through the spectre parametric simulation. We have found that the FE materials with high remnant polarization produces better transfer characteristics and suppressed short channel effects (SCE). The increase in the ferroelectric thickness (t<sub>fe</sub>) has brought out the good impact of 4x improvement in ON current and reduced subthreshold swing of 40 mV/decade. The ON current has been increased with increase in thickness of ferroelectric material and has followed a monotonic trend, where the leakage current becomes a major concern and optimization of crucial parameters such as a diameter of the nanotube has given importance. Relative to the VS- CNFET model, the negative capacitance VS-CNFET model has stacked in ring oscillator (RO) displays immune to delay variation and produces better switching characteristics.</span></p>
 
Publication, Distribution, Etc. Indian Journal of Engineering and Materials Sciences (IJEMS)
2021-01-15 10:26:31
 
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http://op.niscair.res.in/index.php/IJEMS/article/view/44860
 
Data Source Entry Indian Journal of Engineering and Materials Sciences (IJEMS); ##issue.vol## 27, ##issue.no## 4 (2020): IJEMS- AUGUST 2020
 
Language Note en
 
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