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Low Energy X-ray Photons Induced Changes in Lexan Films

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Title Low Energy X-ray Photons Induced Changes in Lexan Films
 
Creator P M, Raveesha
K, Hareesh
V P, Dhamgaye
S D, Dhole
Sanjeev, Ganesh
 
Subject Lexan films
X-ray photons
XRD
FTIR
Microhardness
SEM
Contact angle
 
Description 706-710
40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low
energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using
Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker’s Microhardness Tester,
Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the
C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity
after irradiation. Vicker’s microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM
result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water
contact angle in irradiated Lexan films.
 
Date 2021-10-20T09:05:36Z
2021-10-20T09:05:36Z
2021-10
 
Type Article
 
Identifier 0975-0959 (Online); 0301-1208 (Print)
http://nopr.niscair.res.in/handle/123456789/58310
 
Language en
 
Publisher NIScPR-CSIR, India
 
Source IJPAP Vol.59(10) [October 2021]