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<strong>Lithium Orthosilicate-Linear Low-Density Polyethylene Nano-Composite as Substrate for High Frequency Devices: Dielectric Characterization</strong>

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Title Statement <strong>Lithium Orthosilicate-Linear Low-Density Polyethylene Nano-Composite as Substrate for High Frequency Devices: Dielectric Characterization</strong>
 
Added Entry - Uncontrolled Name Dutta, Pulin ; North Eastern Regional Institute of Science and Technology
Borah, Kunal ; North Eastern Regional Institute of Science and Technology
The authors declare that no funds, grants, or other support were received for carrying out this research work.
 
Uncontrolled Index Term Electronic, structure, electrical, magnetic and optical properties
Complex permittivity; Complex permeability; Return loss; X-band
 
Summary, etc. <span>Dielectric properties of nanosized Lithium Orthosilicate (Li<sub>4</sub>SiO<sub>4</sub>) and linear low-density polyethylene composite at X-Band frequencies are investigated, to realize its utility as a substrate for microwave devices. Solid state technique is used to synthesize nano Li<sub>4</sub>SiO<sub>4</sub>. To confirm the structural and morphological properties of the synthesized nano Li<sub>4</sub>SiO<sub>4</sub>,<sub> </sub>X-ray diffraction, Fourier transformed infrared spectroscopy and transmission electron microscopy are used. Composites of nano Li<sub>4</sub>SiO<sub>4</sub> and linear low-density polyethylene matrix are synthesized with varying weight fraction of nano Li<sub>4</sub>SiO<sub>4</sub> viz. 2%, 4% and 6%. The lateral portion of a fractured sample (composite) is examined using scanning electron microscope to confirm homogeneous dispersion of nano Li<sub>4</sub>SiO<sub>4</sub> in linear low-density polyethylene matrix. <span>Water absorption measurement of all the composites are carried out based on ASTM D570-98</span>. Densities of the composites are measured via hydrostatic weighing by using Archimedes principle. Complex permittivity and permeability measurement of the composites are recorded by utilizing Nicholson-Ross approach. For all weight fraction of the nano inclusions, the real component of permittivity and dielectric loss tangent of the composites in the X-band are found to be in the range of 2.2 – 2.6 and 10<sup>-2 </sup>–10<sup>-4</sup>, respectively. Return losses for the composites are calculated from complex permittivity and permeability values to validate its applicability as substrate for various high frequency applications.</span>
 
Publication, Distribution, Etc. Indian Journal of Pure & Applied Physics (IJPAP)
2022-10-07 16:30:27
 
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http://op.niscair.res.in/index.php/IJPAP/article/view/62590
 
Data Source Entry Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 60, ##issue.no## 10 (2022): Indian Journal of Pure & Applied Physics
 
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