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| Field | Value |
| Title | Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films (vol 233, pg 297, 2004) |
| Names |
VASA, P
SINGH, BP TANEJA, P AYYUB, P |
| Date Issued | 2004 (iso8601) |
| Genre | Correction |
| Identifier | OPTICS COMMUNICATIONS,237,451-451 |