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Title Effect of stress in copper ferrite thin films
 
Names AHMAD, M
DESAI, M
Date Issued 2008 (iso8601)
Abstract Cubic copper ferrite thin films, obtained by rf sputtering on quartz and subsequent post-annealing and quenching, show a large coercivity of about 300-600 Oe. Stress measurements using X-ray diffraction show high value of stress of about 400-1000 MPa. Both the stress and coercivity are found to increase with the decrease of the thickness of the films. There appears to be a contribution of the stress to the coercivity of the films, in the in-plane M-H loops. (c) 2008 Elsevier B.V. All rights reserved.
Genre Letter
Topic Stress
Identifier JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS,320(8)L74-L77