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Field | Value |
Title | A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping |
Names |
MAHAPATRA, S
RAO, VR PARIKH, CD VASI, J CHENG, B WOO, JCS |
Date Issued | 1999 (iso8601) |
Abstract | Lateral Asymmetric Channel (LAC) MOSFETs with channel lengths down to 0.1 mu m have been fabricated and characterized for their electrical performance. Using charge pumping, we show, for the first time, channel V-T profiles obtained experimentally, demonstrating realization of asymmetric channel MOSFETs down to 0.1 mu m channel lengths. Our detailed experimental characterizations show improved performance for LAC MOSFETs over conventional MOSFETs, in addition to excellent hot-carrier reliability. Based on 2-D device simulation results, we attribute the improved hot-carrier reliability in LAC MOSFETs to the reduced peak lateral electric field in the channel. |
Genre | Article; Proceedings Paper |
Identifier | MICROELECTRONIC ENGINEERING,48,193-196 |