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Title Optimization of single halo p-MOSFET implant parameters for improved analog performance and reliability
 
Names JHA, NK
RAMGOPAL RAO, V
WOO, JCS
Date Issued 2002 (iso8601)
Abstract The effect of Channel Hot Carrier (CHC) stress
under typical analog operating conditions is studied for
p-MOSFETs. Our detailed characterization results show
that Single Halo devices not only show improved
performance, but also are immune to CHC degradation
under various operating conditions.
Genre Article
Topic Semiconductor Device Models
Identifier Proceeding of the 32nd European Solid-State Device Research Conference, Firenze, Italy, 24-26 September 2002, 603-606