ICAR Research Data Repository for Knowledge Management
DSpace at IIT Bombay
View Archive InfoMetadata
| Field | Value |
| Title | Performance and reliability of single halo deep sub-micron p-MOSFETs for analog applications |
| Names |
JHA, NK
BAGHINI, MS RAMGOPAL RAO, V |
| Date Issued | 2002 (iso8601) |
| Abstract | The effect of channel hot carrier (CHC) stress under typical analog operating conditions is studied for the first time for single halo (SH) p-MOSFET devices. The SH devices show less degradation under identical operating conditions compared to conventional MOSFETs. The effect of SH implant parameters on device degradation is presented. |
| Genre | Article |
| Topic | Mosfet |
| Identifier | Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits, Singapore, 8-12 July 2002, 35-39 |