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| Field | Value |
| Title | Multiple fault testing of logic resources of SRAM-based FPGAs |
| Names |
GOYAL, S
CHOUDHURY, M RAO, SSSP KUMAR, K |
| Date Issued | 2005 (iso8601) |
| Abstract | We shall present a simple but useful method which detects all multiple stuck-at faults in the application and configuration inputs of LUTs. A novel method for testing of stuck-at faults at control bits of flip flops has also been proposed. The aim is to integrate testing of LUTs, flip flops and multiplexers which will reduce the number of configurations and hence minimize the testing time. |
| Genre | Proceedings Paper |
| Identifier | 18TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: POWER AWARE DESIGN OF VLSI SYSTEMS,742-747 |