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| Field | Value |
| Title | Performance and reliability of high density flash EEPROMs under CHISEL programming operation |
| Names |
MAHAPATRA, S
SHUKURI, S BUDE, JD |
| Date Issued | 2002 (iso8601) |
| Abstract | We demonstrate CHISEL programming operation of fully scaled high-density flash EEPROMs. Single cell program and erase characteristics show reliable. operation in terms of programming disturbs and cycling induced degradation. Program and erase operation of high-density arrays show a unique post-erase operation, tight threshold voltage distribution and over 10 years of data retention even after 105 program/erase cycles. Results are presented showing the feasibility of CHISEL programming operation for deeply scaled high-density flash EEPROMs. |
| Genre | Article |
| Topic | Flash Memories |
| Identifier | Proceeding of the 32nd European Solid-State Device Research Conference, Scotland, UK, 24-26 September 2002, 351-354. |