ICAR Research Data Repository for Knowledge Management
DSpace at IIT Bombay
View Archive InfoMetadata
| Field | Value |
| Title | A novel method to obtain 3-port network parameters from 2-port measurements |
| Names |
JHA, ANURANJAN
VASI, J RUSTAGI, SC PATIL, MB |
| Date Issued | 2004 (iso8601) |
| Abstract | The two-port description of a four-terminal device like a MOSFFT is incomplete. For complete analysis and at higher frequencies, four terminal characteristics have to be obtained. We describe a simple and novel measurement technique to obtain the complete description from two-port measurements on a single test structure. No extra test structures are needed in this procedure. Such measurements are reported for the first time for a MOSFET. |
| Genre | Article |
| Topic | Mosfet |
| Identifier | Proceedings of the International Conference on Microelectronic Test Structures (V 17), Japan, 22-25 March 2004, 57-62 |