| |
| Field |
Value |
| |
| Title |
Scanning probe method : a tool to characterise materials |
| |
| Names |
VENKATARAMANI, N
|
| Date Issued |
1999 (iso8601) |
| Abstract |
A range of scanned probe techniques (SPM) are available today. The SPM's can work under various environments. The Scanning tunneling microscope (STM)has resolved nearest neighbour atoms and the details of individual atoms on a wide variety of surfaces. Similar resolutions have been shown in the atomic force microscopy experiments in recent times. A review of SPM's in vogue today with some details of the important parameters relevant for obtaining the images in an atomic force microscope has been outlined in this tutorial paper. |
| Genre |
Proceedings Paper |
| Topic |
Ferrite Films |
| Identifier |
SOLID STATE PHYSICS, VOL 41, 1998,79-82 |
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