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| Field | Value |
| Title | Substrate bias effect on cycling induced performance degradation of flash EEPROMs |
| Names |
MAHAPATRA, S
SHUKURI, S BUDE, JD |
| Date Issued | 2003 (iso8601) |
| Abstract | Cycling induced performance degradation of flash EEPROMs has been reported for VB=0 and VB<0 programming operation. Compared to VB=0, VB<0 programming shows lower interface degradation for identical cumulative charge fluence (for program) during repetitive program/erase cycling. Reduction in programming gate current has been found to be lower for VB<0 operation under identical interface damage as the VB=0 case. As a consequence, programming under VB<0 condition has been found to cause lower degradation of programming time and programmed VT due to cycling. |
| Genre | Article |
| Topic | Pld Programming |
| Identifier | Proceedings of the 16th International Conference on VLSI Design, New Delhi, India, 4-8 January 2003, 223-226 |