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Field | Value |
Title | Comparison of negative bias temperature instability in HfSiO(N)/TaN and SiO(N)/poly-Si pMOSFETs |
Names |
MAHETA, VD
PURAWAT, S GUPTA, G |
Date Issued | 2007 (iso8601) |
Genre | Proceedings Paper |
Topic | Mosfets |
Identifier | IPFA 2007: PROCEEDINGS OF THE 14TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS,91-95 |