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Title Comparison of negative bias temperature instability in HfSiO(N)/TaN and SiO(N)/poly-Si pMOSFETs
 
Names MAHETA, VD
PURAWAT, S
GUPTA, G
Date Issued 2007 (iso8601)
Genre Proceedings Paper
Topic Mosfets
Identifier IPFA 2007: PROCEEDINGS OF THE 14TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS,91-95