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Gene effects for maydis leaf blight (Drechslera nutydis) resistance and grain yield in white maize (Zea mays)

Indian Agricultural Research Journals

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Title Gene effects for maydis leaf blight (Drechslera nutydis) resistance and grain yield in white maize (Zea mays)
 
Creator DASS, SAIN
ARORA, PAWAN
DHANJU, K S
KUMAR, SURENDER
SINGH, PADAM
 
Subject gene effect, Zea mays, Drechslera maydis, yield
 
Description A study was conducted during 1996-98 on the gene effed for muydis leaf blight( Drechslera maydis) diseaseresistance and grain yield in exotic and indigenous white maize grain (Zea may L.) from line x tester analysis. Theexperiment was conducted under artificial inoculation conditions. Combining ahility analysis revealed that non-additive genetic variances were more important in the expression of disease resistance and high grain yield. There was no similarity in ranking betwecn per-se performance and its corresponding. sea effects of the crosses. In general,it was found that resistance level of the crosses to maydis leaf blight disease was increased where both the parents were having disease reaction resistant/least susceptible followed by resistant x susceptible irrespective of incidence of male parents. Lines L1, L2, L3 and tester T1 were the best general combiners for disease resistance and high yield. L2 x T1 and L3 x T1 were the most desirable combinations having both high per-se performance and high sea effects tbr the traits under study.
 
Publisher The Indian Journal of Agricultural Sciences
 
Contributor
 
Date 2013-03-14
 
Type info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Peer-reviewed Article
 
Format application/pdf
 
Identifier http://epubs.icar.org.in/ejournal/index.php/IJAgS/article/view/28273
 
Source The Indian Journal of Agricultural Sciences; Vol 70, No 5 (2000)
0019-5022
 
Language eng
 
Relation http://epubs.icar.org.in/ejournal/index.php/IJAgS/article/view/28273/12846
 
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