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Genome-wide association study for resistance to tan spot in synthetic hexaploid wheat

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Title Genome-wide association study for resistance to tan spot in synthetic hexaploid wheat
 
Creator Lozano, Nerida
Dreisigacker, Susanne
Sansaloni, Carolina P.
Xinyao He
Sandoval-Islas, Sergio
Perez-Rodriguez, Paulino
Carballo-Carballo, Aquiles
Nava Díaz, Cristian
Kishii, Masahiro
Singh, Pawan K.
 
Subject Aegilops
hard wheat
hexaploidy
spots
genomes
 
Description Synthetic hexaploid wheat (SHW) has shown effective resistance to a diversity of diseases and insects, including tan spot, which is caused by Pyrenophora tritici-repentis, being an important foliar disease that can attack all types of wheat and several grasses. In this study, 443 SHW plants were evaluated for their resistance to tan spot under controlled environmental conditions. Additionally, a genome-wide association study was conducted by genotyping all entries with the DArTSeq technology to identify marker-trait associations for tan spot resistance. Of the 443 SHW plants, 233 showed resistant and 183 moderately resistant reactions, and only 27 were moderately susceptible or susceptible to tan spot. Durum wheat (DW) parents of the SHW showed moderately susceptible to susceptible reactions. A total of 30 significant marker-trait associations were found on chromosomes 1B (4 markers), 1D (1 marker), 2A (1 marker), 2D (2 markers), 3A (4 markers), 3D (3 markers), 4B (1 marker), 5A (4 markers), 6A (6 markers), 6B (1 marker) and 7D (3 markers). In-creased resistance in the SHW in comparison to the DW parents, along with the significant association of resistance with the A and B genome, supported the concept of activating epistasis interaction across the three wheat genomes. Candidate genes coding for F-box and cytochrome P450 proteins that play significant roles in biotic stress resistance were identified for the significant markers. The identified resistant SHW lines can be deployed in wheat breeding for tan spot resistance.
 
Date 2022
2023-01-03T14:13:03Z
2023-01-03T14:13:03Z
 
Type Journal Article
 
Identifier Lozano-Ramírez, N., Dreisigacker, S., Sansaloni, C. P., He, X., Islas, S. S., Pérez-Rodríguez, P., Carballo, A. C., Nava-Díaz, C., Kishii, M., & Singh, P. K. (2022). Genome-wide association study for resistance to tan spot in synthetic hexaploid wheat. Plants, 11(3), 433. https://hdl.handle.net/10883/21994
2223-7747
https://hdl.handle.net/10568/126501
https://hdl.handle.net/10883/21994
https://doi.org/10.3390/plants11030433
 
Language en
 
Rights CC-BY-4.0
Open Access
 
Format application/pdf
 
Publisher MDPI
 
Source Plants