Record Details

<p>Hyper Parameter Optimization for Transfer Learning of ShuffleNetV2 with Edge Computing for Casting Defect Detection</p>

Online Publishing @ NISCAIR

View Archive Info
 
 
Field Value
 
Authentication Code dc
 
Title Statement <p>Hyper Parameter Optimization for Transfer Learning of ShuffleNetV2 with Edge Computing for Casting Defect Detection</p>
 
Added Entry - Uncontrolled Name Prasad, L V Narasimha; Computer Science and Engineering, Institute of Aeronautical Engineering, Hyderabad, 500 043, Telangana, India
Dokku, Durga Bhavani; Computer Science and Engineering, CVR College of Engineering, Hyderabad, 501 510, Telangana, India
Talasila, Sri Lakshmi; Computer Science and Engineering, Prasad V. Potluri Siddhartha Institute of Technology, Vijayawada, 520 007, Andhra Pradesh, India
Tumuluru, Praveen ; Computer Science and Engineering, Koneru Lakshmaiah Education Foundation, Vaddeswaram, 522 302, Andhra Pradesh, India
 
Uncontrolled Index Term Edge Computing, Industrial Internet of Things, NVIDIA Jetson Nano-kit, ShuffleNetV2
 
Summary, etc. <p>A casting defect is an expendable abnormality and the most undesirable thing in the metal casting process. In Casting Defect Detection, deep learning based on Convolution Neural Network (CNN) models has been widely used, but most of these models require a lot of processing power. This work proposes a low-power ShuffleNet V2-based Transfer Learning model for defect identification with low latency, easy upgrading, increased efficiency, and an automatic visual inspection system with edge computing. Initially, various image transformation techniques were used for data augmentation on casting datasets to test the model flexibility in diverse casting. Subsequently, a pre-trained lightweight ShuffleNetV2 model is adapted, and hyperparameters are fine-tuned to optimize the model. The work results in a lightweight, adaptive, and scalable model ideal for resource-constrained edge devices. Finally, the trained model can be used as an edge device on the NVIDIA Jetson Nano-kit to speed up detection. The measures of precision, recall, accuracy, and F1 score were utilized for model evaluation. According to the statistical measures, the model accuracy is 99.58%, precision is 100%, recall is 99%, and the F1-Score is 100 %.</p>
 
Publication, Distribution, Etc. Journal of Scientific & Industrial Research
2023-02-09 21:08:13
 
Electronic Location and Access application/pdf
http://op.niscair.res.in/index.php/JSIR/article/view/70250
 
Data Source Entry Journal of Scientific & Industrial Research; ##issue.vol## 82, ##issue.no## 02 (2023)
 
Language Note en