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Induced variability for yield and its attributing traits in cluster bean [Cyamopsis tetragonoloba (L. ) Taub] through gamma irradiation

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Title Induced variability for yield and its attributing traits in cluster bean [Cyamopsis tetragonoloba (L. ) Taub] through gamma irradiation
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Creator Not Available
 
Subject Cluster bean, Gamma irradiation, Mutation and Variability
 
Description Not Available
Gamma ray is an effective mutagen which creates useful variability for crop like cluster
bean where the natural variation is very meagre and creation of variability by conventional
methods is cumbersome. In the present study, cluster bean cv. Pusa Navbahar was treated
with different level of gamma rays from 50 Gy to 600 Gy with 50Gy interval and obtained
M2 population was subjected to variability estimation for yield and its attributing traits in
augmented block design. The variance between the control and the mutants was found to
be significant for plant height, number of pods per cluster, number of pods per plant, pod
length, pod width, pulp to seed ratio. For these traits, PCV ranged from 14.28 per cent
(pod width) to 31.99 per cent (pulp to seed ratio) whereas, GCV ranged from 10.10 per
cent (pod width) to 24.16 per cent (pulp to seed ratio). The heritability in broad sense
ranged from 50 per cent (pod width) to 79.99 per cent (Plant height). Genetic advance
expressed as percentage over mean ranged from 2.06 per cent (pod width) to 222.44 per
cent (plant height). The traits like plant height, pod length, pod width, pulp to seed ratio
showed sufficient variability due to induced mutation. All these traits showed medium to
high heritability and high genetic advance hence selection for these traits will be effective.
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Date 2023-09-03T10:23:22Z
2023-09-03T10:23:22Z
2021-01-01
 
Type Research Paper
 
Identifier Not Available
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http://krishi.icar.gov.in/jspui/handle/123456789/80519
 
Language English
 
Relation Not Available;
 
Publisher Not Available