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  • » Dynamic Kernel Scatter-difference-based discriminant analysis for diagnosis of...
    SUMANA, C; VENKATESWARLU, C; GUDI, RD; BHUSHAN, M
    2024-11-27
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  • » Control of hysteresis and kinematic error nonlinearities in harmonic drives for high...
    GANDHI, PS; GHORBEL, FH
    2024-11-27
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  • » Arc-length-based Lyapunov tests for convergence and stability in systems having a...
    BHAT, SP; BERNSTEIN, DS
    2024-11-27
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  • » Output-feedback semiglobal stabilization of stall dynamics for eliminating hysteresis...
    CHATURVEDI, NA; BHAT, SP
    2024-11-27
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  • » An efficient integration algorithm for a class of discontinuous dynamical systems in...
    AGRAWAL, J; MOUDGALYA, KM; PANI, AK
    2024-11-27
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  • » CPW-fed modified rectangular printed monopole antenna with slot
    RAY, KP; RANGA, Y
    2024-11-27
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  • » Extensive reliability analysis of Tungsten dot NC devices embedded in HfAlO high-k...
    SINGH, PK; NAINANI, A
    2024-11-27
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  • » A phase based method for investigating the functional connectivity in the fMRI data
    DESHMUKH, AV; SHIVHARE, V; GADRE, VM; PATKAR, DP; SHAH, S; PUNGAVKAR, S
    2024-11-27
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  • » Thin film Single Halo (SH) SOI nMOSFETs short channel performance in mixed signal...
    HAKIM, NUD; RAO, VR; VASI, J
    2024-11-27
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  • » On the physical mechanism of NBTI in silicon oxynitride p-MOSFETs: can differences in...
    MAHAPATRA, S; AHMED, K; VARGHESE, D; ISLAM, AE; GUPTA, G; MADHAV, L; SAHA, D; ALAM, MA
    2024-11-27
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  • » Response surface methodology for statistical characterization of nano CMOS devices and...
    MANDE, S; CHANDORKAR, AN
    2024-11-27
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  • » Comparison of negative bias temperature instability in HfSiO(N)/TaN and SiO(N)/poly-Si...
    MAHETA, VD; PURAWAT, S; GUPTA, G
    2024-11-27
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  • » Design of geosynthetic reinforced retaining walls
    MANDAL, JN
    2024-11-27
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  • » Reliability of single and dual layer Pt Nanocrystal devices for NAND flash applications...
    SINGH, PK; BISHT, G; SIVATHEJA, M; SANDHYA, C; MUKHOPADHYAY, G; MAHAPATRA, S; HOFMANN, R; SINGH, K; KRISHNA, N
    2024-11-27
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  • » A new physical insight and 3D device modeling of sti type denmos device failure under...
    SHRIVASTAVA, M; SCHNEIDER, J; BAGHINI, MS; GOSSNER, H; RAO, VR
    2024-11-27
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  • » Highly resistive body STI Ndemos : an optimized demos device to achieve moving current...
    SHRIVASTAVA, M; SCHNEIDER, J; BAGHINI, MS; GOSSNER, H; RAO, VR
    2024-11-27
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  • » NBTI lifetime prediction in SiON p-MOSFETs by H/H2 Reaction-Diffusion(RD) and...
    DEORA, S; MAHETA, VD; MAHAPATRA, S
    2024-11-27
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  • » Interaction between heating-cooling cycles, sodium sulfate solution and external...
    DAVE, UV; DESAI, YM
    2024-11-27
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  • » Applicability of dual layer metal nanocrystal flash memory for NAND 2 or 3-bit/cell...
    SINGH, P; SANDHYA, C; AULUCK, K; BISHT, G; SIVATHEJA, M; HOFMANN, R; MUKHOPADHYAY, G; MAHAPATRA, S; SINGH, PK; BISHT, KAG; SIVATHEJA, M; MUKHOPADHYAY, G; MAHAPATRA, S; HOFMANN, R
    2024-11-27
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  • » On the failure mechanism and current instabilities in RESURF type DeNMOS device under...
    SHRIVASTAVA, M; SCHNEIDER, J; BAGHINI, MS; GOSSNER, H; RAO, VR
    2024-11-27
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  • » On the differences between 3D filamentation and failure of N & P type drain extended...
    SHRIVASTAVA, M; BYCHIKHIN, S; POGANY, D; SCHNEIDER, J; BAGHINI, MS; GOSSNER, H; GORNIK, E; RAO, VR
    2024-11-27
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  • » Parameter extraction for MOS model 11 using particle swarm optimization
    CHOPDE, AM; KHANDELWAL, S; THAKKER, RA; PATIL, MB; ANIL, KG
    2024-11-27
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  • » Application of fast DC analysis to partitioning hypergraphs
    TRIVEDI, G; NARAYANAN, H
    2024-11-27
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  • » Effects of polypropylene, polyester and glass fibres on various strengths of ordinary...
    DAVE, UV; DESAI, YM
    2024-11-27
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  • » On distributed function computation in structure-free random networks
    KAMATH, S; MANJUNATH, D
    2024-11-27
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