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  • » Drain bias dependence of gate oxide reliability in conventional and asymmetrical...
    ANIL, KG; MAHAPATRA, S; EISELE, I; RAMGOPAL RAO, V; VASI, J
    2024-11-28
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  • » Distributed PC based routers: bottleneck analysis and architecture proposal
    KHAN, AJ; BIRKE, R; MANJUNATH, D; SAHOO, ANIRUDHA; BIANCO, A
    2024-11-28
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  • » QNAT: a graphical tool for the analysis of queueing networks
    MANJUNATH, D; BHASKAR, DM; TAHILRAMANI, H; BOSE, SK; UMESH, MN
    1998-11-28
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  • » Distributed arithmetic architecture for image coding
    MERCHANT, SN; RAO, BV
    1989-11-28
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  • » A simple wind driven self-excited induction generator with regulated output voltage
    WEKHANDE, S; AGARWAL, VIVEK
    1999-11-28
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  • » Impact of amplitude phase correlation on oscillator phase noise model
    MUKHERJEE, JAYANTA
    2024-11-28
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  • » A matte-less, variational approach to automatic scene compositing
    RAMAN, SHANMUGANATHAN; CHAUDHURI, SUBHASIS
    2024-11-28
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  • » Application of the principal partition and principal lattice of partitions of a graph...
    ROY, SUBIR; NARAYANAN, H
    1993-11-28
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  • » Channel engineering for high speed sub-1.0 V power supply deep sub-micron CMOS
    CHENG, BAOHONG; INANI, ANAND; RAMGOPAL RAO, V; WOO, JCS
    1999-11-28
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  • » Observation of thickness dependent properties in novel multiferroic thin films
    PRASHANTHI, K; DUTTAGUPTA, SP; PINTO, RICHARD; PALKAR, VR
    2024-11-28
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  • » Anhydrous silanization and antibody immobilization on hotwire CVD deposited silicon...
    JOSHI, M; SINGH, S; SWAIN, B; PATIL, SAMADHAN B; DUSANE, RO; RAMGOPAL RAO, V; MUKHERJI, SOUMYA
    2024-11-28
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  • » Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs
    RAMGOPAL RAO, V; WIJERATNE, G; CHU, D; BROZEK, T; VISWANATHAN, CR
    1998-11-28
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  • » Forward body-biased single halo MOS devices for low voltage analog circuits
    NARASIMHULU, K; RAMGOPAL RAO, V
    2024-11-28
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  • » End-to-end QoS over internet
    JOSHI, R; SARAPH, GIRISH P
    2024-11-28
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  • » The effects of varying tilt angle of halo implant on the performance of sub 100nm LAC...
    SARKAR, P; MALLIK, A; SARKAR, CK; RAMGOPAL RAO, V
    2024-11-28
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  • » Edge detection using scale space knowledge
    KULKARNI, ANOOP; SHEVGAONKAR, RK; SAHASRABUDHE, SC
    1993-11-28
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  • » A predictive reliability model for PMOS bias temperature degradation
    MAHAPATRA, S; ALAM, MA
    2024-11-28
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  • » A simple and direct method for interface characterization of OFETs
    SRINIVAS, P; TIWARI, SP; RAVAL, HN; RAMESH, RN; CAHYADI, T; MHAISALKAR, SG; RAMGOPAL RAO, V
    2024-11-28
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  • » Metallated porphyrin self assembled monolayers as Cu diffusion barriers for the...
    KHADERBAD, MA; NAYAK, K; YEDUKONDALU, M; RAVIKANTH, M; MUKHERJI, SOUMYA; RAMGOPAL RAO, V
    2024-11-28
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  • » A novel dynamic threshold operation using electrically induced junction MOSFET in the...
    DIXIT, ABHISEK; RAMGOPAL RAO, V
    2024-11-28
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  • » Estimation of process variation impact on DG-FinFET device performance using...
    CHANDORKAR, AN; MANDE, SUDHAKAR; IWAI, HIROSHI
    2024-11-28
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  • » Sub-threshold swing degradation due to localized charge storage in SONOS memories
    TOMAR, BHAWNA; RAMGOPAL RAO, V
    2024-11-28
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  • » Optimization of single halo p-MOSFET implant parameters for improved analog performance...
    JHA, NK; RAMGOPAL RAO, V; WOO, JCS
    2024-11-28
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  • » Capacitance degradation due to fringing field in deep sub-micron MOSFETs with High-K...
    INANI, A; RAMGOPAL RAO, V; CHENG, B; ZEITZOFF, P; WOO, JCS
    1999-11-28
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  • » Extended Pascal for SIMD processing
    PATKAR, SACHIN; PANDURANGAN, C
    1989-11-28
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