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- » Drain bias dependence of gate oxide reliability in conventional and asymmetrical...
ANIL, KG; MAHAPATRA, S; EISELE, I; RAMGOPAL RAO, V; VASI, J
2024-10-31
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- » Distributed PC based routers: bottleneck analysis and architecture proposal
KHAN, AJ; BIRKE, R; MANJUNATH, D; SAHOO, ANIRUDHA; BIANCO, A
2024-10-31
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- » QNAT: a graphical tool for the analysis of queueing networks
MANJUNATH, D; BHASKAR, DM; TAHILRAMANI, H; BOSE, SK; UMESH, MN
1998-10-31
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- » Distributed arithmetic architecture for image coding
MERCHANT, SN; RAO, BV
1989-10-31
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- » A simple wind driven self-excited induction generator with regulated output voltage
WEKHANDE, S; AGARWAL, VIVEK
1999-10-31
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- » Impact of amplitude phase correlation on oscillator phase noise model
MUKHERJEE, JAYANTA
2024-10-31
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- » A matte-less, variational approach to automatic scene compositing
RAMAN, SHANMUGANATHAN; CHAUDHURI, SUBHASIS
2024-10-31
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- » Application of the principal partition and principal lattice of partitions of a graph...
ROY, SUBIR; NARAYANAN, H
1993-10-31
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- » Channel engineering for high speed sub-1.0 V power supply deep sub-micron CMOS
CHENG, BAOHONG; INANI, ANAND; RAMGOPAL RAO, V; WOO, JCS
1999-10-31
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- » Observation of thickness dependent properties in novel multiferroic thin films
PRASHANTHI, K; DUTTAGUPTA, SP; PINTO, RICHARD; PALKAR, VR
2024-10-31
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- » Anhydrous silanization and antibody immobilization on hotwire CVD deposited silicon...
JOSHI, M; SINGH, S; SWAIN, B; PATIL, SAMADHAN B; DUSANE, RO; RAMGOPAL RAO, V; MUKHERJI, SOUMYA
2024-10-31
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- » Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs
RAMGOPAL RAO, V; WIJERATNE, G; CHU, D; BROZEK, T; VISWANATHAN, CR
1998-10-31
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- » Forward body-biased single halo MOS devices for low voltage analog circuits
NARASIMHULU, K; RAMGOPAL RAO, V
2024-10-31
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- » End-to-end QoS over internet
JOSHI, R; SARAPH, GIRISH P
2024-10-31
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- » The effects of varying tilt angle of halo implant on the performance of sub 100nm LAC...
SARKAR, P; MALLIK, A; SARKAR, CK; RAMGOPAL RAO, V
2024-10-31
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- » Edge detection using scale space knowledge
KULKARNI, ANOOP; SHEVGAONKAR, RK; SAHASRABUDHE, SC
1993-10-31
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- » A predictive reliability model for PMOS bias temperature degradation
MAHAPATRA, S; ALAM, MA
2024-10-31
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- » A simple and direct method for interface characterization of OFETs
SRINIVAS, P; TIWARI, SP; RAVAL, HN; RAMESH, RN; CAHYADI, T; MHAISALKAR, SG; RAMGOPAL RAO, V
2024-10-31
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- » Metallated porphyrin self assembled monolayers as Cu diffusion barriers for the...
KHADERBAD, MA; NAYAK, K; YEDUKONDALU, M; RAVIKANTH, M; MUKHERJI, SOUMYA; RAMGOPAL RAO, V
2024-10-31
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- » A novel dynamic threshold operation using electrically induced junction MOSFET in the...
DIXIT, ABHISEK; RAMGOPAL RAO, V
2024-10-31
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- » Estimation of process variation impact on DG-FinFET device performance using...
CHANDORKAR, AN; MANDE, SUDHAKAR; IWAI, HIROSHI
2024-10-31
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- » Sub-threshold swing degradation due to localized charge storage in SONOS memories
TOMAR, BHAWNA; RAMGOPAL RAO, V
2024-10-31
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- » Optimization of single halo p-MOSFET implant parameters for improved analog performance...
JHA, NK; RAMGOPAL RAO, V; WOO, JCS
2024-10-31
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- » Capacitance degradation due to fringing field in deep sub-micron MOSFETs with High-K...
INANI, A; RAMGOPAL RAO, V; CHENG, B; ZEITZOFF, P; WOO, JCS
1999-10-31
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- » Extended Pascal for SIMD processing
PATKAR, SACHIN; PANDURANGAN, C
1989-10-31
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